发明名称 COMPOUND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a compound semiconductor device in which a semiconductor/metal interface of proper quality without residues can be obtained in any region which forms a source electrode, a drain electrode and a gate electrode. <P>SOLUTION: A method of manufacturing a compound semiconductor device includes the steps of forming a compound semiconductor laminated structure 4 on a substrate 1; forming metal films 5A to 5C on the compound semiconductor laminated structure; forming a source electrode 7 and a drain electrode 8 on the metal films: oxidizing or nitriding a part of the metal films and forming a metal oxide film or a metal nitride film 5CX; and forming a gate electrode 9 on the metal oxide film or the metal nitride film. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011187728(A) 申请公布日期 2011.09.22
申请号 JP20100052105 申请日期 2010.03.09
申请人 FUJITSU LTD 发明人 TAGI TOSHIHIRO
分类号 H01L21/338;H01L21/28;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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