| 摘要 |
PROBLEM TO BE SOLVED: To provide a technique which effectively screens defective site of a memory device. SOLUTION: When the write parameter dependency of a write probability regarding a writing means, in writing into each memory section or the other condition dependence of the writing parameters dependent on the writing probability is not included in a desired range, it is determined that there is a defect. As a result, the detection ratio of an abnormal cell with respect to a case where the write parameter dependency of the write probability of having a factor causing failure is improved and the improvement in the quality of the memory device becomes possible. COPYRIGHT: (C)2011,JPO&INPIT
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