发明名称 METHOD OF POLISHING A SUBSTRATE COMPRISING POLYSILICON AND AT LEAST ONE OF SILICON OXIDE AND SILICON NITRIDE
摘要 A method for chemical mechanical polishing of a substrate is provided, comprising: providing a substrate, wherein the substrate comprises polysilicon and at least one of silicon oxide and silicon nitride; providing a chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; and an alkyl aryl polyether sulfonate compound, wherein the alkyl aryl polyether sulfonate compound has a hydrophobic portion having an alkyl group bound to an aryl ring and a nonionic acyclic hydrophilic portion having 4 to 100 carbon atoms; providing a chemical mechanical polishing pad with a polishing surface; moving the polishing surface relative to the substrate; dispensing the chemical mechanical polishing composition onto the polishing surface; and, abrading at least a portion of the substrate to polish the substrate; wherein at least some of the polysilicon is removed from the substrate; and, wherein at least some of the at least one of silicon oxide and silicon nitride is removed from the substrate.
申请公布号 US2011230050(A1) 申请公布日期 2011.09.22
申请号 US20100724990 申请日期 2010.03.16
申请人 GUO YI;LIU ZHENDONG;REDDY KANCHARLA-ARUN KUMAR;ZHANG GUANGYUN 发明人 GUO YI;LIU ZHENDONG;REDDY KANCHARLA-ARUN KUMAR;ZHANG GUANGYUN
分类号 H01L21/306 主分类号 H01L21/306
代理机构 代理人
主权项
地址