Planar, light sensitive semiconductor component i.e. solar cell, examining method, involves supplying characteristic of component as input value, and utilizing values of characteristic for recognizing damages or defects of component

摘要

The method involves successively changing light brightness i.e. line-like light brightness, in relation to portions of a semiconductor component i.e. solar cell (1). Characteristic e.g. voltage and/or power, of the semiconductor component is detected and supplied as an input value of an evaluating device (20). The detected values of the characteristic of the semiconductor component are used for recognizing damages or defects of the semiconductor component. Electrical terminals (17, 18) are provided at the solar cell, where the generated voltage is measured by the solar cell. An independent claim is also included for a device for examining a planar, light sensitive semiconductor component.