CONTACT PROBE AND PROBE UNIT

摘要

A contact probe (20) having a substantially flat plate shape, used to connect different substrates and having a uniform plate thickness. The contact probe (20) is provided with: a first contact section (21) which has a side surface curved in an arc shape and which makes contact with one substrate at the side surface thereof; a second contact section (22) which has a side surface curved in an arc shape and which makes contact with the other substrate at the side surface thereof; a connection section (23) which connects the first contact section (21) and the second contact section (22); and an elastic section (24) which extends from the second contact section (22), has a portion curved in an arc shape, and is elastically deformed by a load applied to the first contact section (21) and the second contact section (22).