| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and device for effectively screening a defective site of a memory device. SOLUTION: In the method for screening memory device, the memory device includes a plurality of memory sections, a data writing means, and a data reading means is provided with a step of obtaining a characteristic value, showing variations in the results of a plurality of times of writing, when data is written in a predetermined memory section among the memory sections a plurality of times under one or more environmental conditions; and a step of comparing the characteristic values with the first set values established in advance and determining whether the predetermined memory section is defective. COPYRIGHT: (C)2011,JPO&INPIT
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