| 摘要 |
According to one embodiment, a test circuit comprises a function block, a test circuit, and a signal generation circuit. The test circuit is arranged in an area close to the function block having a plurality of transistors. The test circuit comprises a first flip-flop circuit, a second flip-flop circuit, and a logic circuit connected between the output of the first flip-flop circuit and the input of the second flip-flop circuit. The signal generation circuit generates clock pulses including a first clock pulse and a second clock pulse. The signal generation circuit is capable of controlling a pulse interval between the first clock pulse and the second clock pulse. In a test, the first flip-flop circuit outputs data in synchronization with the first clock pulse of the signal generation circuit and the second flip-flop circuit latches data in synchronization with the second clock pulse of the signal generation circuit.
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