发明名称 |
ASSESSMENT DEVICE, ASSESSMENT SYSTEM, ASSESSMENT METHOD AND COMPUTER PROGRAM |
摘要 |
A reader (200) reads an IC tag (10) via an antenna (ANT) and assesses the similarity between the acquired read pattern and reference data for each assessment area. For the reference data, a pattern that the detector of a gate is to output when a tag is caused to pass through the gate and a pattern that the detector of the gate is to output when the tag is caused to pass through another gate are prepared. The assessment results are reported to a top-level server (100). The top-level server (100), on the basis of a similarity report from the reader (200), assesses whether the accuracy detected at the first-mentioned gate when the tag had been caused to pass through the gate or the accuracy detected at the first-mentioned gate when the tag had been caused to pass through the other gate was higher. |
申请公布号 |
WO2011114474(A1) |
申请公布日期 |
2011.09.22 |
申请号 |
WO2010JP54597 |
申请日期 |
2010.03.17 |
申请人 |
FUJITSU LIMITED;SUGANO, HIROYASU;SHIOTSU, SHINICHI |
发明人 |
SUGANO, HIROYASU;SHIOTSU, SHINICHI |
分类号 |
G06K17/00;B65G1/137;B65G61/00 |
主分类号 |
G06K17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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