发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <p>In a matrix including a plurality of memory cells, each in which a drain of a writing transistor is connected to a gate of a reading transistor and the drain is connected to one electrode of a capacitor, a gate of the writing transistor is connected to a writing word line, a source of the writing transistor and a source of the reading transistor is connected to a bit line, and a drain of the reading transistor is connected to a reading word line. A conductivity type of the writing transistor is different from a conductivity type of the reading transistor. In order to increase the integration degree, a bias line may be substituted with a reading word line in another row, or memory cells are connected in series so as to have a NAND structure, and a reading word line and a writing word line may be shared.</p>
申请公布号 WO2011114905(A1) 申请公布日期 2011.09.22
申请号 WO2011JP55002 申请日期 2011.02.25
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;TAKEMURA, YASUHIKO 发明人 TAKEMURA, YASUHIKO
分类号 H01L21/8242;G11C11/405;H01L27/108 主分类号 H01L21/8242
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