发明名称 Semiconductor device having oxide semiconductor layer and manufacturing method thereof
摘要 An object is to provide a semiconductor device of which a manufacturing process is not complicated and by which cost can be suppressed, by forming a thin film transistor using an oxide semiconductor film typified by zinc oxide, and a manufacturing method thereof. For the semiconductor device, a gate electrode is formed over a substrate; a gate insulating film is formed covering the gate electrode; an oxide semiconductor film is formed over the gate insulating film; and a first conductive film and a second conductive film are formed over the oxide semiconductor film. The oxide semiconductor film has at least a crystallized region in a channel region.
申请公布号 EP1770788(A3) 申请公布日期 2011.09.21
申请号 EP20060019112 申请日期 2006.09.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 AKIMOTO, KENGO;HONDA, TATSUYA;SONE, NORIHITO
分类号 H01L29/786;G02F1/1368;H01L21/20;H01L21/336;H01L21/77;H01L51/50 主分类号 H01L29/786
代理机构 代理人
主权项
地址