| 摘要 |
Automatic test equipment (ATE) includes circuitry configured to pass a signal in a channel of the ATE, and memory configured to store a first and second correction values. A first correction value is based on a first version of the signal, where the first correction value is for use in correcting static non-linearity associated with the channel. A second correction value is based on a second version of the signal, where the second correction value is for use in correcting dynamic non-linearity associated with the channel. Digital signal processing logic is configured to use the first correction value, the second correction value, and the signal in order to compensate for harmonic distortion from the channel.
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