发明名称 |
MASK BLANK AND PHOTOMASK |
摘要 |
<p>A mask blank and a photomask are provided to form a proper and adaptive structure by improving a composition thereof. A light shielding layer(12) is formed on a light transmitting substrate(10). A mask blank for manufacturing an FPD device is used for forming a laser drawing resist layer on the light shielding layer. The light shielding layer is formed with a controlled layer so that a reflectance of a layer surface to a laser drawing wavelength is equal to and less than 15 percent. The laser drawing wavelength is a wavelength which is selected from a wavelength range of 350nm to 500nm. The light shielding layer includes an anti-reflective layer and a crystalline control layer for controlling crystallinity of the anti-reflective layer.</p> |
申请公布号 |
KR20110103917(A) |
申请公布日期 |
2011.09.21 |
申请号 |
KR20110079215 |
申请日期 |
2011.08.09 |
申请人 |
HOYA CORPORATION;HOYA ELECTRONICS MALAYSIA SENDIRIAN BERHAD |
发明人 |
MITSUI MASARU;SANO MICHIAKI |
分类号 |
H01L21/027;G03F1/50;G03F1/54 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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