发明名称 MASK BLANK AND PHOTOMASK
摘要 <p>A mask blank and a photomask are provided to form a proper and adaptive structure by improving a composition thereof. A light shielding layer(12) is formed on a light transmitting substrate(10). A mask blank for manufacturing an FPD device is used for forming a laser drawing resist layer on the light shielding layer. The light shielding layer is formed with a controlled layer so that a reflectance of a layer surface to a laser drawing wavelength is equal to and less than 15 percent. The laser drawing wavelength is a wavelength which is selected from a wavelength range of 350nm to 500nm. The light shielding layer includes an anti-reflective layer and a crystalline control layer for controlling crystallinity of the anti-reflective layer.</p>
申请公布号 KR20110103917(A) 申请公布日期 2011.09.21
申请号 KR20110079215 申请日期 2011.08.09
申请人 HOYA CORPORATION;HOYA ELECTRONICS MALAYSIA SENDIRIAN BERHAD 发明人 MITSUI MASARU;SANO MICHIAKI
分类号 H01L21/027;G03F1/50;G03F1/54 主分类号 H01L21/027
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