发明名称 Methods for fabricating PMOS metal gate structures
摘要 Methods of forming a microelectronic structure are described. Those methods may include forming a gate dielectric layer on a substrate, forming a metal gate layer on the gate dielectric layer, and then forming a polysilicon layer on the metal gate layer in situ, wherein the metal gate layer is not exposed to air.
申请公布号 US8021940(B2) 申请公布日期 2011.09.20
申请号 US20070968099 申请日期 2007.12.31
申请人 INTEL CORPORATION 发明人 METZ MATTHEW V.;DOCZY MARK L.;DEWEY GILBERT;KAVALIEROS JACK
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
主权项
地址