发明名称 Approach method for probe and sample in scanning probe microscope
摘要 In detecting a displacement of a cantilever (2) by a displacement detecting mechanism (5) and allowing a probe (1) and a sample (8) to approach each other by at least one of a coarse-movement mechanism (13) and a vertical direction fine-movement mechanism (11) at the same time, an excitation mechanism (4) excites the cantilever (2) with a first excitation condition and the probe (1) and the sample (8) are allowed to approach each other with a first stop condition, and then the cantilever (2) is excited with a second excitation condition different from the first excitation condition, a second stop condition is set, and the probe (1) and the sample (8) are allowed to approach each other by the at least one of the vertical direction fine-movement mechanism (11) and the coarse-movement mechanism (13) until the second stop condition is satisfied.
申请公布号 US8024816(B2) 申请公布日期 2011.09.20
申请号 US20100700236 申请日期 2010.02.04
申请人 SII NANOTECHNOLOGY INC. 发明人 IYOKI MASATO;SHIKAKURA YOSHITERU;WATANABE MASAFUMI
分类号 G01Q10/00;G02B6/26 主分类号 G01Q10/00
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