发明名称 AMORPHOUS GE/TE DEPOSITION PROCESS
摘要 <p>Germanium, tellurium, and/or antimony precursors are usefully employed to form germanium-, tellurium- and/or antimony-containing films, such as films of GeTe, GST, and thermoelectric germanium-containing films. Processes for using these precursors to form amorphous films are also described. Further described is the use of [{nBuC(iPrN) 2 } 2 Ge] or Ge butyl amidinate to form GeTe smooth amorphous films for phase change memory applications.</p>
申请公布号 KR101065829(B1) 申请公布日期 2011.09.20
申请号 KR20080108119 申请日期 2008.10.31
申请人 发明人
分类号 H01L21/20;H01L21/205;H01L21/8247;H01L27/115 主分类号 H01L21/20
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