发明名称 Voltage level comparison circuit of semiconductor memory apparatus, voltage adjustment circuit using voltage level comparison circuit, and semiconductor memory apparatus using the same
摘要 A voltage adjustment circuit of a semiconductor memory apparatus includes a control voltage generating unit configured to distribute an external voltage for selectively outputting a plurality of distribution voltages as a control voltage in response to a control signal, the plurality of the distribution voltages each have different voltage levels, a comparing unit configured to include a voltage supply unit configured to control an external voltage supplied to a first node and a second node if a level of an output voltage is higher than a level of a reference voltage in response to a level of the control voltage, and a detection signal generating unit configured to drop potential levels of the first and second nodes according to the levels of the output voltage and the reference voltage, and to output the potential level of the second node as a detection signal, and a voltage generating unit configured to drive the external voltage according to a potential level of the detection signal and to output the external voltage as the output voltage.
申请公布号 US8023356(B2) 申请公布日期 2011.09.20
申请号 US20080336423 申请日期 2008.12.16
申请人 HYNIX SEMICONDUTOR, INC. 发明人 OH IC-SU;KIM YONG-JU;HAN SUNG-WOO;SONG HEE-WOONG;KIM HYUNG-SOO;HWANG TAE-JIN;CHOI HAE-RANG;LEE JI-WANG;JANG JAE-MIN;PARK CHANG-KUN
分类号 G11C5/14 主分类号 G11C5/14
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