发明名称 Capacitors integrated with metal gate formation
摘要 A semiconductor structure including a capacitor having increased capacitance and improved electrical performance is provided. The semiconductor structure includes a substrate; and a capacitor over the substrate. The capacitor includes a first layer including a first capacitor electrode and a second capacitor electrode, wherein the first capacitor electrode is formed of a metal-containing material and is free from polysilicon. The semiconductor structure further includes a MOS device including a gate dielectric over the substrate; and a metal-containing gate electrode on the gate dielectric, wherein the metal-containing gate electrode is formed of a same material, and has a same thickness, as the first capacitor electrode.
申请公布号 US8022458(B2) 申请公布日期 2011.09.20
申请号 US20070868856 申请日期 2007.10.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHANG CHUNG-LONG;LU DAVID DING-CHUNG;CHEN CHIA-YI;WU I-LU
分类号 H01L27/108 主分类号 H01L27/108
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