发明名称 TANTALUM NITRIDE FILM FORMATION METHOD AND FILM FORMATION DEVICE THEREFORE
摘要 A method for forming a tantalum nitride film, which comprises supplying a gaseous nitrogen atom-containing compound, as a reactant gas and supplying gaseous t-amylimido-tris-(dimethylamide)tantalum, as a gaseous raw material, to the surface of the substrate S to thus form a tantalum nitride film on the surface of the substrate S; and a film-forming apparatus, which comprises a reactant gas supply line L4; a container 13 for liquefy a raw material; an evaporator 11 for gasify the liquefied raw material; a liquid mass flow controller 12 for controlling the amount of the liquid raw material to be supplied; and a gaseous raw material supply line L1. These method and apparatus would permit the stable supply of the gaseous raw material at all times and the improvement of the throughput of the substrate to be processed and as a result, the method and the apparatus permit the improvement of the productivity of the tantalum nitride film.
申请公布号 KR20110102415(A) 申请公布日期 2011.09.16
申请号 KR20117015593 申请日期 2009.12.07
申请人 ULVAC, INC. 发明人 YAMAMOTO AKIKO;USHIKAWA HARUNORI;KATO NOBUYUKI;YAMADA TAKAKAZU
分类号 H01L21/285;C23C16/34 主分类号 H01L21/285
代理机构 代理人
主权项
地址
您可能感兴趣的专利