发明名称 SEMICONDUCTOR DEVICE HAVING IMPROVED RELIABILITY
摘要 A semiconductor includes a plurality of active regions that are separated from each other on a substrate by a device isolation layer and extend in a first direction, the active regions having two opposite ends and a center region; wordlines that are buried in and cross the active regions and extend in a second direction, which is different from the first direction, wherein a wordline that crosses an active region crosses between one of the two opposite ends and the center region of the active region; first contact plugs on the two opposite ends of the active regions, each contact plug overlapping a border between the active region and the device isolation layer; and second contact plugs formed on the first contact plugs.
申请公布号 KR20110101979(A) 申请公布日期 2011.09.16
申请号 KR20100021383 申请日期 2010.03.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAEK, CHEOL HO;HONG, HYEONG SUN;HWANG, YOO SANG
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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