发明名称 |
TIMING GENERATOR, TEST DEVICE, AND TEST RATE CONTROL METHOD |
摘要 |
A delay setting data generator generates delay setting data based on rate data. A variable delay circuit delays the test pattern data by a delay time determined by the delay setting data with reference to a predefined unit amount of delay. First rate data designates the period of the test pattern data with a precision determined by the unit amount of delay. Second rate data designates the period of the test pattern data with a precision higher than that determined by the unit amount of delay. The delay setting data generator outputs a first value and a second value in a time division manner at a ratio determined by the second rate data, the first and second values being determined by the first rate data. |
申请公布号 |
KR20110102417(A) |
申请公布日期 |
2011.09.16 |
申请号 |
KR20117015600 |
申请日期 |
2009.10.29 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
WATANABE DAISUKE;OKAYASU TOSHIYUKI |
分类号 |
H03K3/02;G01R31/28;H03K5/13 |
主分类号 |
H03K3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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