发明名称 TIMING GENERATOR, TEST DEVICE, AND TEST RATE CONTROL METHOD
摘要 A delay setting data generator generates delay setting data based on rate data. A variable delay circuit delays the test pattern data by a delay time determined by the delay setting data with reference to a predefined unit amount of delay. First rate data designates the period of the test pattern data with a precision determined by the unit amount of delay. Second rate data designates the period of the test pattern data with a precision higher than that determined by the unit amount of delay. The delay setting data generator outputs a first value and a second value in a time division manner at a ratio determined by the second rate data, the first and second values being determined by the first rate data.
申请公布号 KR20110102417(A) 申请公布日期 2011.09.16
申请号 KR20117015600 申请日期 2009.10.29
申请人 ADVANTEST CORPORATION 发明人 WATANABE DAISUKE;OKAYASU TOSHIYUKI
分类号 H03K3/02;G01R31/28;H03K5/13 主分类号 H03K3/02
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