发明名称 CONTACT TYPE ELECTRONIC INSPECTION MODULE
摘要 PROBLEM TO BE SOLVED: To provide a contact type electronic inspection module, capable of preventing abrasion of a conductive terminal, protecting contact points of an integrated circuit and other electronic products, acquiring excellent conductivity, and replacing easily the conductive terminal. SOLUTION: This contact type electronic inspection module includes a substrate 1 and a plurality of conductive terminals 2. The substrate 1 is provided with a plurality of terminal holes. The plurality of conductive terminals 2 are arranged into the plurality of terminal holes, respectively. Both ends of the conductive terminal 2 are exposed from the upper surface and the bottom surface of the substrate 1, respectively. The conductive terminal 2 has an elastomer, and one or more conductive filaments provided on a center of the elastomer. The conductive filament has an elastic part provided on a middle, and conductive parts provided on both ends so as to be exposed from both ends of the elastomer. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011180091(A) 申请公布日期 2011.09.15
申请号 JP20100047005 申请日期 2010.03.03
申请人 TSAI YUNG-CHI 发明人 TSAI YUNG-CHI
分类号 G01R1/073;G01R1/067;H01R13/24 主分类号 G01R1/073
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