发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>Provided are a semiconductor memory device and a method of manufacturing the semiconductor memory device. The semiconductor memory device includes a semiconductor substrate including a first active region and a second active region, a gate electrode including a silicide layer formed on the first active region and a resistor pattern formed on the second active region. A distance from a top surface of the semiconductor substrate to a top surface of the resistor pattern is smaller than a distance from a top surface of the semiconductor substrate to a top surface of the gate electrode.</p>
申请公布号 KR20110100738(A) 申请公布日期 2011.09.15
申请号 KR20100019729 申请日期 2010.03.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JONG WON
分类号 H01L21/8247;H01L27/02;H01L27/115 主分类号 H01L21/8247
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