SOLAR CELL INSPECTION DEVICE, SOLAR CELL INSPECTION METHOD, AND PROGRAM

摘要

Disclosed is an inspection device for solar cells which enables the identification of the location of band-shaped defects in solar cells. The disclosed inspection device for solar cells is provided with a defect location identification means which identifies the location of band-shaped defects in a solar cell by applying a search window (43) to a cell image which displays the solar cell in an energised state. The search window (43) includes a band-shaped first region (40a) and a second region (40b) which is divided in two by the first region (40a). The search window (43) of the defect location identification means can identify band-shaped defects which extend in the same direction as the first region (40a) on the basis of the brightness inside the first region (40a) and the brightness inside the second region (40b) in the cell image at a specified time.