发明名称 PROCESS FOR PRODUCTION OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 <p>An underlayer conductive member (207) is formed on the surface of a substrate (201) and in a hole part (205), and a resist (208) is formed on a part of the underlayer conductive member (207) on which a conductive material layer (209, 210) is not formed. The conductive material layer (209, 210) is formed on a part other the part having the resist (208) formed thereon, and a mask metal (212) is formed on the conductive material layer (209, 210). Subsequently, the resist (208) is removed, and the underlayer conductive member (207) is etched using the mask metal (212) as a mask, thereby forming the conductive material layer (209, 210) in a desired shape.</p>
申请公布号 WO2011111308(A1) 申请公布日期 2011.09.15
申请号 WO2011JP00864 申请日期 2011.02.17
申请人 PANASONIC CORPORATION;MURAGISHI, ISAO;KAI, TAKAYUKI;SAITO, DAISHIRO;YAMAMOTO, DAISUKE;KOIWASAKI, TAKESHI 发明人 MURAGISHI, ISAO;KAI, TAKAYUKI;SAITO, DAISHIRO;YAMAMOTO, DAISUKE;KOIWASAKI, TAKESHI
分类号 H01L21/3205;H01L21/60;H01L23/12;H01L23/52;H01L27/00 主分类号 H01L21/3205
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