MICROSCOPE PROBE AND METHOD FOR MANUFACTURING SAME

摘要

According to the present invention, a microscope probe comprises: a tip, the vertex of which is to be attached to one side of a cantilever and is formed into a triangular shape; and multiple layers made of a plurality of materials stacked onto the vertex of the tip, wherein the vertex is arranged to maintain a predetermined angle with respect to a substrate which is being scanned and disposed below the tip. The microscope probe and a method for manufacturing the same according to the present invention involve multiple layers made of a plurality of stacked materials so as to achieve Raman enhancement on the tip of the microscope probe, to thereby improve sharpness and resolution.