| 摘要 |
PROBLEM TO BE SOLVED: To measure timing precision of strobe signal accurately using a free pattern. SOLUTION: The semiconductor testing device is equipped with: a testing part 4 provided to a comparator part 13; a pattern data memory part 1 which stores, for each rate signal, the pattern for generating a driver enable signal being synchronized only with the generation timing of a strobe signal to be measured; a pattern outputting part 11 for outputting the strobe signal to be measured and the driver enable signal; and a measuring signal generating part 6 which is detachable to the testing part 4 in which operation is made at a timing of system clock signal whose cycle is shorter than rate signal, and which outputs the measuring signal input into the comparator part 13 based on the strobe synchronous signal, for changing delay amount applied to the measuring signal. The comparator part 13 compares the measurement signal with an expected value at the timing of the strobe signal to be measured, for measurement of timing precision of the strobe to be measured. COPYRIGHT: (C)2011,JPO&INPIT
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