发明名称 LENS-DEFECT INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a lens-defect inspection device capable of inspecting the defects of a lens with high accuracy, while preventing foreign matters adhered to the lens from being deemed a defect by effectively using a facial illuminator, a liquid crystal panel, an imaging means and a foreign-matter removal means and which is made simple in constitution and cane beg formed at low cost. SOLUTION: The lens-defect inspection device is equipped with: the facial illuminator; the liquid crystal panel arranged between the face illuminator and an inspection target lens, capable of setting a light pervious part and a light-shielding section in a predetermined pattern; the imaging means for imaging the inspection target lens by the light emitted from the facial illuminator, to pass through the liquid crystal panel and the foreign-matter removing means for blowing air at a predetermined pressure on the inspection target lens for removing the foreign matter adhered to the inspection target lens; and a control means for controlling the face illuminator, the liquid crystal panel, the imaging means and the foreign-matter removing means. Furthermore, the control means compares the imaging data, before and after the operation of the foreign-matter removing means with each other, to thereby determine the presence of foreign matters. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011179898(A) 申请公布日期 2011.09.15
申请号 JP20100042885 申请日期 2010.02.26
申请人 DISK TEKKU KK 发明人 KUDO YASUSHI;HASEGAWA MASAHITO;KATO AKIHIRO
分类号 G01N21/88;G01M11/00;G01N21/94;G01N21/958 主分类号 G01N21/88
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