发明名称 SURFACE INSPECTION APPARATUS
摘要 <p>Disclosed is a surface inspection apparatus which comprises an annular illumination device (3) that includes a ring-shaped light emitting unit (3A) and a light shielding plate (3B), the light shielding plate (3B) having an optical opening of which diameter is smaller than the inside diameter of the light emitting unit (3A) and being disposed between the light emitting unit (3A) and a steel plate (2) so as to be concentric with the light emitting unit (3A), and an imaging unit (4) that is disposed on the center line (C) of the opening of the light shielding plate (3B) and that captures images of the surface of the steel plate (2) through the opening. Only light beams diffracted by the edge portion of the opening of the light shielding plate (3B) among light beams emitted from the light emitting unit (3A) are incident on an imaging area (A) on the surface of the steel plate (2) to be imaged by the imaging unit (4). The distance H between the light emitting unit (3A) and the surface of the steel plate (2) is set such that the average brightness level in the imaging area (A) is more than or equal to a predetermined level and a difference in the brightness level in the imaging area (A) is in a predetermined range. With this, minute point-like flaws can be accurately detected.</p>
申请公布号 WO2011111528(A1) 申请公布日期 2011.09.15
申请号 WO2011JP54013 申请日期 2011.02.23
申请人 JFE STEEL CORPORATION;OKUNO, MAKOTO;TAKADA, HIDEKI;MURATA, SAIICHI 发明人 OKUNO, MAKOTO;TAKADA, HIDEKI;MURATA, SAIICHI
分类号 G01N21/892 主分类号 G01N21/892
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