| 摘要 |
PROBLEM TO BE SOLVED: To test an output of a high-voltage generation circuit and a negative voltage generation circuit by a tester dedicated to positive voltage. SOLUTION: A test circuit 10 includes a first voltage dividing circuit 11 and a second voltage dividing circuit 12. The first voltage dividing circuit 11 includes: first and second resistive elements R1, R2 connected in series between a ground or reference voltage generation circuit 1 and a high-voltage generation circuit 2 and dividing a voltage between a ground voltage or reference voltage Vref and a high-voltage Vp to generate a first positive voltage V1 that can be measured by a tester dedicated to positive voltage; and a buffer BF outputting the first positive voltage V1. The second voltage dividing circuit 12 includes: first and second resistive elements R1, R2 connected in series between a negative voltage generation circuit 3 and the reference voltage generation circuit 1 and dividing a voltage between a negative voltage Vn and the reference voltage Vref to generate a second positive voltage V2 that can be measured by the tester dedicated to positive voltage; and a buffer BF outputting the second positive voltage V2. COPYRIGHT: (C)2011,JPO&INPIT
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