发明名称 APPARATUS AND METHOD FOR MONITORING GLASS PLATE POLISHING STATE
摘要 Disclosed are an apparatus and a method for monitoring a glass plate polishing state. The apparatus may include a location measuring unit for measuring a location on a glass plate being polished by a polishing machine, a current measuring unit for measuring an electric current flowing into the polishing machine, a memory unit for storing a reference value of the electric current flowing into the polishing machine for each polishing location of the glass plate, and a control unit for determining whether a polishing state is faulty, by comparing a value of the electric current measured by the current measuring unit for each polishing location measured by the location measuring unit with a corresponding reference value of the electric current stored in the memory unit for each polishing location.
申请公布号 US2011223834(A1) 申请公布日期 2011.09.15
申请号 US201113045273 申请日期 2011.03.10
申请人 发明人 MOON WON-JAE;OH HYUNG-YOUNG;LEE DAE-YEON;SONG JAE-IK;KIM YOUNG-KUK;CHUNG KYU-CHUL;CHUNG HYUN-CHUL
分类号 B24B49/10;B24B7/24;B24B37/00;B24B37/005;B24B37/34;B24B49/16 主分类号 B24B49/10
代理机构 代理人
主权项
地址