发明名称 Method for an accelerated excitation wavelength scan in a fluorescence microscope
摘要 <p>Determining an excitation spectrum and/or an emission spectrum of at least one fluorescent dye by a fluorescence microscope, comprises: illuminating a sample exhibiting the fluorescent dye with an excitation light of a first excitation wavelength (40); detecting a detection light of a given detection wavelength range emanating from the sample; and determining the excitation- and/or the emission spectra depending on the detection of the detected light. A first illumination phase and at least one second illumination phase are carried out. Determining an excitation spectrum and/or an emission spectrum of at least one fluorescent dye by a fluorescence microscope, comprises: illuminating a sample exhibiting the fluorescent dye with an excitation light of a first excitation wavelength (40); detecting a detection light of a given detection wavelength range emanating from the sample; and determining the excitation- and/or the emission spectra depending on the detection of the detected light. A first illumination phase and at least one second illumination phase are carried out, where in the first illumination phase, the sample is illuminated with the excitation light of the first excitation wavelength, and the detection light of a first detection wavelength range (31) is detected by a first detector, and simultaneously at least a detection light of a second detection wavelength range (32) is detected by a second detector. In the second illumination phase, the sample is illuminated with the excitation light of a second excitation wavelength, and the detection light of at least the first- and/or the second detection wavelength range is detected.</p>
申请公布号 EP2365317(A1) 申请公布日期 2011.09.14
申请号 EP20110155130 申请日期 2011.02.21
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 SIEBER, JOCHEN
分类号 G01N21/64;C12M1/34 主分类号 G01N21/64
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