发明名称 |
Semiconductor device including field-effect transistor using salicide (self-aligned silicide) structure and method of fabricating the same |
摘要 |
An element isolation region for electrically isolating an element region where an element is to be formed is formed in a semiconductor substrate. A gate insulating film is formed on the semiconductor substrate in the element region. A gate electrode is formed on the gate insulating film. Source/drain regions are formed to be separated from each other in a surface region of the semiconductor substrate. The source/drain regions sandwich a channel region formed below the gate insulating film. Gate sidewall films are formed on the two side surfaces of the gate electrode. Silicide films are formed on the source/drain regions so as to be separated from the element isolation region.
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申请公布号 |
US8017510(B2) |
申请公布日期 |
2011.09.13 |
申请号 |
US20070838679 |
申请日期 |
2007.08.14 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
MATSUDA SATOSHI |
分类号 |
H01L21/28;H01L21/3205;H01L21/336;H01L29/41;H01L29/417;H01L29/423;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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