发明名称 Semiconductor device including field-effect transistor using salicide (self-aligned silicide) structure and method of fabricating the same
摘要 An element isolation region for electrically isolating an element region where an element is to be formed is formed in a semiconductor substrate. A gate insulating film is formed on the semiconductor substrate in the element region. A gate electrode is formed on the gate insulating film. Source/drain regions are formed to be separated from each other in a surface region of the semiconductor substrate. The source/drain regions sandwich a channel region formed below the gate insulating film. Gate sidewall films are formed on the two side surfaces of the gate electrode. Silicide films are formed on the source/drain regions so as to be separated from the element isolation region.
申请公布号 US8017510(B2) 申请公布日期 2011.09.13
申请号 US20070838679 申请日期 2007.08.14
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUDA SATOSHI
分类号 H01L21/28;H01L21/3205;H01L21/336;H01L29/41;H01L29/417;H01L29/423;H01L29/78 主分类号 H01L21/28
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