| 摘要 |
<p>A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target in a color-unevenness inspection; and an image generation section generating an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each unit region and identifying an uneven-color region based on a magnitude of the calculated chroma. The color-unevenness inspection apparatus further includes: a calculation section calculating, for the uneven-color region in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; and an inspection section performing the color-unevenness inspection based on the calculated evaluation parameter. The image generation section calculates the chroma, in each unit region of the picked-up image, while performing correction processing that reflects variations in color-unevenness visibility from color to color.</p> |
