发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING AN ETCHANT
摘要 In an etchant for etching a capping layer having etching selectivity with respect to a dielectric layer, the capping layer changes compositions of the dielectric layer, to thereby control a threshold voltage of a gate electrode including the dielectric layer. The etchant includes about 0.01 to 3 percent by weight of an acid, about 10 to 40 percent by weight of a fluoride salt and a solvent. Accordingly, the dielectric layer is prevented from being damaged by the etching process for removing the capping layer and the electric characteristics of the gate electrode are improved.
申请公布号 US2011217833(A1) 申请公布日期 2011.09.08
申请号 US201113040472 申请日期 2011.03.04
申请人 LEE HYO-SAN;YOON BO-UN;LEE KUN-TACK;CHO HAG-JU;HYUN SANG-JIN;NA HOON-JOO;HONG HYUNG-SEOK 发明人 LEE HYO-SAN;YOON BO-UN;LEE KUN-TACK;CHO HAG-JU;HYUN SANG-JIN;NA HOON-JOO;HONG HYUNG-SEOK
分类号 H01L21/28 主分类号 H01L21/28
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