发明名称 Precise Critical Temperature Indicator and Manufacturing Method Therefor
摘要 A precise critical temperature indicator is applied to small products requiring refrigeration or freezing to control the operation of a temperature sensor built into an integrated structure of a single body. A method for manufacturing said precise critical temperature indicator, wherein a plurality of development medium members and a plurality of development material members are opposed to each other, and blocking members are interposed therebetween to support the development medium members and the development material members separately from each other, the development medium members are provided with paths for moving development materials, or paths for movement of development materials can be shortened to adjust speed, and an indication unit is arranged to indicate the state of the development materials at an end or central portion of the development medium when the development materials are exposed to a critical temperature for a predetermined time period.
申请公布号 US2011214602(A1) 申请公布日期 2011.09.08
申请号 US200913125802 申请日期 2009.10.21
申请人 INDITECH KOREA CO., LTD. 发明人 PARK JI HOON
分类号 G01K1/02;B23P17/04 主分类号 G01K1/02
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