发明名称 LITHOGRAPHIC APPARATUS AND METHOD FOR CORRECTING POSITION OF STAGE OF LITHOGRAPHIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus having an improved positioning accuracy of a stage thereof. <P>SOLUTION: A lithographic apparatus includes: a stage that holds an object and is movable relative to a reference structure within a motion range; a magnet structure that provides a spatially varying magnetic field in at least a part of the motion range and is movable relative to the reference structure and the stage; a first position measuring system to provide a first measurement signal corresponding to a position of the stage and/or the object in a measuring direction relative to the reference structure; a second position measuring system to provide a second measurement signal corresponding to a position of the stage relative to the magnet structure; and a data processor that corrects the first measurement signal with a value dependent on the second measurement signal to provide a first corrected measurement signal representing the position of the stage and/or the object in the measuring direction relative to the reference structure. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011176310(A) 申请公布日期 2011.09.08
申请号 JP20110031905 申请日期 2011.02.17
申请人 ASML NETHERLANDS BV 发明人 BUTLER HANS;EUSSEN EMIEL JOZEF MELANIE;KOENEN WILLEM HERMAN GERTRUDA ANNA;VAN DER PASCH ENGELBERTUS ANTONIUS FRANSISCUS;HARMEN KLAAS VAN DER SCHOOT;VAN DER WIJST MARC WILHELMUS MARIA;VERMAELEN MARKUS MARTINUS PETRUS ADRIANUS;DE HOON CORNELIUS ADRIANUS LAMBERTUS
分类号 H01L21/027;H01L21/68 主分类号 H01L21/027
代理机构 代理人
主权项
地址