发明名称 |
LITHOGRAPHIC APPARATUS AND METHOD FOR CORRECTING POSITION OF STAGE OF LITHOGRAPHIC APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus having an improved positioning accuracy of a stage thereof. <P>SOLUTION: A lithographic apparatus includes: a stage that holds an object and is movable relative to a reference structure within a motion range; a magnet structure that provides a spatially varying magnetic field in at least a part of the motion range and is movable relative to the reference structure and the stage; a first position measuring system to provide a first measurement signal corresponding to a position of the stage and/or the object in a measuring direction relative to the reference structure; a second position measuring system to provide a second measurement signal corresponding to a position of the stage relative to the magnet structure; and a data processor that corrects the first measurement signal with a value dependent on the second measurement signal to provide a first corrected measurement signal representing the position of the stage and/or the object in the measuring direction relative to the reference structure. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011176310(A) |
申请公布日期 |
2011.09.08 |
申请号 |
JP20110031905 |
申请日期 |
2011.02.17 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
BUTLER HANS;EUSSEN EMIEL JOZEF MELANIE;KOENEN WILLEM HERMAN GERTRUDA ANNA;VAN DER PASCH ENGELBERTUS ANTONIUS FRANSISCUS;HARMEN KLAAS VAN DER SCHOOT;VAN DER WIJST MARC WILHELMUS MARIA;VERMAELEN MARKUS MARTINUS PETRUS ADRIANUS;DE HOON CORNELIUS ADRIANUS LAMBERTUS |
分类号 |
H01L21/027;H01L21/68 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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