发明名称 |
MEMORY EFFECT EVALUATION PROGRAM, MEMORY EFFECT EVALUATION METHOD, AND MEMORY EFFECT EVALUATION APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To easily and previously evaluate memory effects of an amplifier. SOLUTION: Two signals of different frequencies are input to an amplifier and an output waveform of the amplifier is measured to acquire a fundamental wave, third-order IMD (Inter Modulation Distortion) and fifth-order IMD (step S10). A coefficient corresponding to memoryless nonlinear distortion regardless of memory effects of the amplifier is then calculated from the fundamental wave, third-order IMD and fifth-order IMD obtained by the measurement (step S20). Continuously, a value representing characteristics of memory nonlinear distortion caused by the memory effects of the amplifier is calculated (step S30). When calculating these coefficient and characteristic value, an operation expression is used which represents a distortion occurrence model of the amplifier distinguishably considering memoryless nonlinear distortion and memory nonlinear distortion. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011176751(A) |
申请公布日期 |
2011.09.08 |
申请号 |
JP20100040744 |
申请日期 |
2010.02.25 |
申请人 |
FUJITSU LTD |
发明人 |
TAKANO TAKESHI;OISHI YASUYUKI;NAKAMURA MICHIHARU;HASE KAZUO;KIMURA JUICHI |
分类号 |
H03F1/32;H03F3/189;H03F3/24;H04B1/04 |
主分类号 |
H03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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