发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a memory device that prevents a variation in a start-up time of a word line, and cell characteristics by adapting the boosting capability of a charge pump to the amount of the word line in writing operation while preventing are increased in memory area. <P>SOLUTION: The memory device includes: the word lines; the charge pump that applies first to n-th (n is an integer of≤2) voltages which are different from one another in the writing operation; an application-voltage selector that selects voltages applied to the word lines among the first to n-th voltages; a word-line number register that stores the number of the word line numbers to which each of the first to n-th voltages is applied for the first to n-th voltages; a storage part that stores a correspondence table that stores a relationship between the number of the word lines for each of the first to n-th voltages and the number of charge pumps allocated to the first to n-th voltages; and a generation-voltage selector that allocates the charge pumps to generate the first to n-th voltages according to the number of word lines. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011175712(A) 申请公布日期 2011.09.08
申请号 JP20100039898 申请日期 2010.02.25
申请人 TOSHIBA CORP 发明人 SHIGA HITOSHI
分类号 G11C16/06;G11C16/04 主分类号 G11C16/06
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