发明名称 Method and apparatus for calibrating a test system for measuring a device under test
摘要 Methods and apparatus for calibrating a vector network analyzer (VNA) and characterizing a device under test. In one example, a device fixture (110) including a pair of embedded device adapters (150,155) provides an interface between a device under test (DUT) with non-coaxial connectors and the coaxial connectors of the VNA (170), and moves the calibration reference plane from the coaxial connectors of the VNA to a DUT reference plane (190a,190b) at the leads/connectors of the DUT. A through fixture (510) having a pair of similar through adapters (520,525) is used to establish the DUT reference plane and to facilitate characterizing the device adapters such that they can be de-embedded from measurements of the device fixture.
申请公布号 EP2363719(A1) 申请公布日期 2011.09.07
申请号 EP20110153600 申请日期 2011.02.07
申请人 ATE SYSTEMS, INC 发明人 ADAMIAN, VAHE;PHILLIPS, PETER
分类号 G01R27/32;G01R35/00 主分类号 G01R27/32
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