PROCESS FOR TESTING THE RESISTANCE OF AN INTEGRATED CIRCUIT TO A SIDE CHANNEL ANALYSIS

摘要

The method involves dividing a set of physical parameters into subset of lateral points each corresponding to an elementary operation of an integrated circuit. A general hypothesis is formed for values corresponding to the subset of lateral points. A value of the physical parameters is estimated for the subset of lateral points. A statistical processing step is performed for the subset of lateral points using the estimated value of the physical parameters if the general hypothesis is correct. An independent claim is also included for a system for testing an integrated circuit.