发明名称 |
X-RAY FLUORESCENCE ANALYZING METHOD |
摘要 |
An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A). |
申请公布号 |
EP2333529(A4) |
申请公布日期 |
2011.09.07 |
申请号 |
EP20100813564 |
申请日期 |
2010.07.01 |
申请人 |
RIGAKU CORPORATION |
发明人 |
WATANABE, KENJI;KATAOKA, YOSHIYUKI;YAMADA, YASUJIRO;MORIKAWA, ATSUSHI |
分类号 |
G01N23/223;G01N23/203 |
主分类号 |
G01N23/223 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|