发明名称 Melt surface position monitoring apparatus in silicon single crystal growth process
摘要 The liquid surface position of the melt in the crucible in the silicon single crystal growth process utilizing the Czochralski method is monitored using the melt surface position on the occasion of seeding as a reference position and an estimated melt surface position can be calculated according to every situation, so that the distance between the melt and the thermal shield or water-cooling structure can be controlled with high precision. When the estimated melt surface position passes a preset upper limit and approaches the thermal shield, an alarm goes off and, further, when the melt comes into contact with the thermal shield or approaches the water-cooling structure, an alarm goes off if desired and, at the same time, the crucible is forcedly stopped from moving, so that a serious accident such as steam-incurred explosion resulting from the melt coming into contact with the water-cooling structure can be prevented. Accordingly, the apparatus can be widely applied as a melt surface position monitoring apparatus making it possible to safely operate any silicon single crystal growth apparatus utilizing the Czochralski method.
申请公布号 US8012258(B2) 申请公布日期 2011.09.06
申请号 US20070802792 申请日期 2007.05.25
申请人 SUMCO CORPORATION 发明人 HAYAKAWA HIROSHI;MAEDA TOKUJI
分类号 C30B15/00 主分类号 C30B15/00
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