发明名称 Charged-particle detector
摘要 This ion detector includes an MCP and a plurality of planar dynodes respectively having a plurality of slits. The plurality of planar dynodes are stacked via spacers parallel to an electron output plane of the MCP, and the first stage planar dynode is opposed parallel to the electron output plane. In accordance with this ion detector, it is possible to obtain output signals having the linearity reaching mV order, and to shorten its pulse width to approximately 600 ps.
申请公布号 US8013294(B2) 申请公布日期 2011.09.06
申请号 US20090607410 申请日期 2009.10.28
申请人 HAMAMATSU PHOTONICS K.K. 发明人 SUYAMA MOTOHIRO;OHMURA TAKAYUKI;KOBAYASHI HIROSHI
分类号 H01J49/40;H01J43/00 主分类号 H01J49/40
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