发明名称 Apparatus and method for measuring thickness of ink layer in pixel
摘要 Provided are an apparatus and method for measuring the thickness of an ink layer in a pixel and a method of controlling nozzles of an inkjet head using the apparatus and method. The apparatus includes: a substrate; a plurality of pixels disposed on the substrate and filled with ink due to a printing operation; first and second electrodes corresponding to the pixels, the first and second electrodes disposed on opposite sides of each of the pixels; and a capacitance measurement circuit electrically connected to the first and second electrodes to measure the capacitance of each of the pixels.
申请公布号 US8011749(B2) 申请公布日期 2011.09.06
申请号 US20080123713 申请日期 2008.05.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SANG-IL;KIM TAE-GYUN;CHA TAE-WOON;WEE SANG-KWON
分类号 B41J29/38;B41J29/393;G01F23/00 主分类号 B41J29/38
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