发明名称 III-NITRIDE SEMICONDUCTOR GROWTH SUBSTRATE, III-NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE, III-NITRIDE SEMICONDUCTOR ELEMENT, III-NITRIDE SEMICONDUCTOR FREESTANDING SUBSTRATE, AND METHOD FOR FABRICATING THESE
摘要 An object of the present invention is to address the problems described herein and to provide a III-nitride semiconductor epitaxial substrate, a III-nitride semiconductor element, and a III-nitride semiconductor freestanding substrate, which have good crystallinity, not only with AlGaN, GaN, or GaInN, the growth temperature of which is at or below 1050 °C, but also with Al x Ga 1-x N, the growth temperature of which is high and which has a high Al composition, as well as a III-nitride semiconductor growth substrate for fabricating these and a method for efficiently fabricating these. The invention is characterized by being equipped with: a crystal growth substrate, at least the surface portion of which substrate includes a III-nitride semiconductor containing Al; and a single metallic layer formed on the surface portion, the single metallic layer being made from Zr or Hf.
申请公布号 KR20110099040(A) 申请公布日期 2011.09.05
申请号 KR20117016554 申请日期 2009.12.25
申请人 DOWA HOLDINGS CO., LTD.;DOWA ELECTRONICS MATERIALS CO., LTD. 发明人 TOBA RYUICHI;MIYASHITA MASAHITO;TOYOTA TATSUNORI
分类号 H01L21/20;C30B29/38;H01L21/205 主分类号 H01L21/20
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