发明名称 |
RESIST UNDERLAYER FILM FORMING METHOD, PATTERN FORMING METHOD AND COMPOSITION, ADDITIVE FOR RESIST UNDERLAYER FILM FORMING MATERIAL, CROSSLINKING AGENT, AND RESIST UNDERLAYER FILM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a resist underlayer film-forming method capable of forming a resist underlayer film that has a function as an antireflective film and that is excellent in pattern transfer performance and etching resistance, to provide an underlayer film that does not bend in micronized pattern transfer and a method of forming the underlayer; and also to provide a pattern forming method. <P>SOLUTION: The resist underlayer film is formed of a composition containing (A) a resin containing an aromatic ring and (B) a compound expressed by general formula (i). <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011170059(A) |
申请公布日期 |
2011.09.01 |
申请号 |
JP20100033159 |
申请日期 |
2010.02.18 |
申请人 |
JSR CORP |
发明人 |
MINEGISHI SHINYA;NAKAFUJI SHINYA;KOMURA KAZUHIKO;NAKANO TAKANORI |
分类号 |
G03F7/11;G03F7/26;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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