发明名称 NONLINEAR TYPE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To obtain phase information of object light emitted from a specimen by the non-linear type optical effect. SOLUTION: The nonlinear type microscope 101 is used for observing nonlinear object light emitted from a specimen 102 by virtue of a nonlinear optical effect after irradiating the specimen 102 with excitation lightω1 andω2. The non-linear microscope 101 includes: a galvano mirror 119 for scanning the excitation lightω1 andω2 on the observation surface of the specimen 102; a phase shifter 117 for shifting the phase of reference lightωr that has an angular frequency equal to that of the nonlinear type object light; and a detector 122 for detecting light interfering with nonlinear type object light and reference lightωr. The phase shifter 117 shifts the phase of reference lightωr by 90°each time the condensing position of the excitation lightω1 andω2 on the observation surface moves by a prescribed distance in the direction of axis x. The present invention can be applied, for example, in the nonlinear type laser scanning microscope. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011170212(A) 申请公布日期 2011.09.01
申请号 JP20100035503 申请日期 2010.02.22
申请人 NIKON CORP 发明人 FUKUTAKE NAOKI
分类号 G02B21/06;G01N21/65;G02B21/18;G02B26/10 主分类号 G02B21/06
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