发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device which controls disturbance at writing/erasing and suppresses an increase in area. <P>SOLUTION: The nonvolatile semiconductor memory device includes a first well region of a first conductivity type in which a first cell array 32 containing a plurality of memory cells MC has been formed, a second well region of a first conductivity type in which a second cell array 32 containing a plurality of memory cells MC has been formed, and a third well region of a second conductivity type containing the first and second well regions, and further includes a bit line BL commonly connected to a memory cell which the first cell array 32 contains and a memory cell which the second cell array 32 contains and a column decoder 13 connected to the bit line BL. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011171582(A) 申请公布日期 2011.09.01
申请号 JP20100035028 申请日期 2010.02.19
申请人 TOSHIBA CORP 发明人 KASAI TAKAMICHI;UMEZAWA AKIRA;ISOBE KAZUAKI;HIRATA YOSHIHARU
分类号 H01L21/8247;G11C16/02;G11C16/06;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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