发明名称 |
INSPECTION DEVICE UTILIZING EDDY CURRENTS |
摘要 |
An example inspection probe device includes a sensor assembly configured to induce an eddy current in a component. A probe body houses at least a portion of the sensor assembly such that the portion of the sensor assembly is spaced from a target surface of the component when the probe body is in contact with the component. A controller is used to calculate the location of the target surface relative to the probe body using an eddy current parameter sensed by the sensor assembly.
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申请公布号 |
US2011210725(A1) |
申请公布日期 |
2011.09.01 |
申请号 |
US20100713410 |
申请日期 |
2010.02.26 |
申请人 |
SMITH KEVIN D;SULLIVAN JONATHAN P;RAULERSON DAVID A |
发明人 |
SMITH KEVIN D.;SULLIVAN JONATHAN P.;RAULERSON DAVID A. |
分类号 |
G01N27/82 |
主分类号 |
G01N27/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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