SEMICONDUCTOR ELEMENT AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor element where a probe for testing hardly protrudes from an external electrode even if adjacent semiconductor element regions (IC region) are simultaneously inspected, and to provide a semiconductor wafer and a method of manufacturing a semiconductor device. SOLUTION: The semiconductor element 38 is rectangular and includes a plurality of external electrodes 28 that are arranged along the outer circumference, and facing two sides of the external electrode are directed in a vertical direction 36 to one diagonal line 34 of the semiconductor element. COPYRIGHT: (C)2011,JPO&INPIT